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Step Height Standard (SHS)

  • Our multipurpose Nanuler Calibration Standard is designed for calibration of AFM, SEM, Optical and Mechanical Profilers

  • Features include step heights, lines, grids, magnification box and spot measurement structures of different pitch

  • The features are etched into SiO₂ and Si and are optionally available with metal coating for improved reflectivity and reduced static charge

Step Height

Desctiption

Part Number

Price

Quantity

25 µm

Si Step

STEP-Si-25

$825

25 µm

Si Step Height Reference mounted on Quartz

STEP-Si-25-Q

$935

25 µm

Si Step Height Reference mounted on Metal

STEP-Si-25-D

$847

25 µm

Si Step , metal coated

STEP-Si-25-M

$847

25 µm

Si Step, metal coated, mounted on Quartz

STEP-Si-25-M-Q

$957

25 µm

Si Step, metal coated, mounted on Metal

STEP-Si-25-M-D

$869

Technical Specifications

SNOM-C

SNOM-NC

Step Height Standard

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