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Step Height Standard (SHS)
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Our multipurpose Nanuler Calibration Standard is designed for calibration of AFM, SEM, Optical and Mechanical Profilers
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Features include step heights, lines, grids, magnification box and spot measurement structures of different pitch
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The features are etched into SiO₂ and Si and are optionally available with metal coating for improved reflectivity and reduced static charge
Step Height
Desctiption
Part Number
Price
Quantity
500 nm
SiO₂ Step
STEP-OX-0.5
$440
500 nm
SiO₂ Step mounted on Quartz
STEP-OX-0.5-Q
$550
500 nm
SiO₂ Step mounted on Metal
STEP-OX-0.5-D
$462
500 nm
SiO₂ Step Metal coated
STEP-OX-0.5-M
$462
500 nm
SiO₂ Step metal coated and mounted on Quartz
STEP-OX-0.5-M-Q
$572
500 nm
SiO₂ Step metal coated and mounted on Metal
STEP-OX-0.5-M-D
$484
1 µm
SiO₂ Step
STEP-OX-1
$550
1 µm
SiO₂ Step mounted on Quartz
STEP-OX-1-Q
$660
1 µm
SiO₂ Step mounted on Metal
STEP-OX-1-D
$572
1 µm
SiO₂ Step Metal coated
STEP-OX-1-M
$572
1 µm
SiO₂ Step metal coated and mounted on Quartz
STEP-OX-1-M-Q
$682
1 µm
SiO₂ Step metal coated and mounted on Metal
STEP-OX-1-M-D
$594
Technical Specifications
SNOM-C
SNOM-NC
Step Height Standard
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