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Specialty Probes |
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FCL Series
Applied NanoStructures' FCL Series consists of tipless force calibration probes with five cantilevers. These probes are designed for the spring constant calibration of SPM probes.
- Length (µm): 52-442
- Spring Constant (N/m): 0.12-77
- Frequency (kHz): 14-1000
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TAP-TALL
Applied Nanostructures' TAP-TALL probes have a specially designed 65 µm tall tip for profiling high aspect ratio features and deep trenches. Standard probes are suitable for profiling 10-15 µm features.
- Length (µm): 225
- Spring Constant (N/m): 209
- Frequency (kHz): 140
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TAP-TALLA
Applied Nanostructures' TAP-TALLA probes have a specially designed 65 µm tall tip for profiling high aspect ratio features and deep trenches, and have Aluminum coating on the reflex side to increase laser signal quality. Standard probes are only suitable for profiling 10-15 µm features.
- Length (µm): 225
- Spring Constant (N/m): 209
- Frequency (kHz): 140
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