Applied NanoStructures silicon probes are manufactured out of prime grade, low resistivity n-type Antimony doped, single crystal silicon. Our well-established silicon technology combined with our novel micro-fabrication processes are the key ingredients for achieving high quality monolithic probes with unprecedented tip sharpness. We have many standard silicon probe series designed for a wide variety of applications.

ACCESS™ Silicon Probes
AppNano ACCESS™ probes are sharp silicon probes that allow a direct optical view of the AFM tip and designed for applications that require seeing the tip as it engages the surface.
Base Specifications: Length (µm): 140 Spring Constant (N/m): 50 Frequency (kHz): 300
ACL Series Our ACL probes are fabricated from highly doped, monolithic silicon, and are designed for tapping / non-contact mode applications. These probes feature a long, thin cantilever that allows for greater laser clearance than our standard ACT model. Base Specifications: Length (µm): 225 Spring Constant (N/m): 45 Frequency (kHz): 190 ACT Series Our ACT probes are fabricated from highly doped, monolithic silicon, and are designed for tapping / non-contact mode applications. These probes feature a short cantilever. Base Specifications: Length (µm): 125 Spring Constant (N/m): 40 Frequency (kHz): 300
FCL™ Series
Applied NanoStructures' FCL™ Series consists of tipless force calibration probes with five cantilevers. These probes are designed for the spring constant calibration of SPM probes.
Base Specifications: Length (µm): 52-442 Spring Constant (N/m): 0.12-77 Frequency (kHz): 14-1000

FORT Series
Our FORT probes are fabricated from highly doped, monolithic silicon, and are designed for force modulation mode applications. These probes have a medium frequency and spring constant that make them ideally suited for Force Modulation Microscopy.
Base Specifications: Length (µm): 225 Spring Constant (N/m): 3.0 Frequency (kHz): 62

SHOCON Series
Applied NanoStructures' SHOCON probes are fabricated from highly doped, monolithic silicon, and feature shorter cantilevers than our SICON Series. SHOCON probes are ideal for contact mode applications.
Base Specifications: Length (µm): 225 Spring Constant (N/m): 0.10 Frequency (kHz): 28

SICON Series
Applied NanoStructures' SICON probes are fabricated from highly doped, monolithic silicon, and feature longer cantilevers than the SHOCON Series. SICON probes are designed for contact mode applications.
Base Specifications: Length (µm): 450 Spring Constant (N/m): 0.2 Frequency (kHz): 12

HART0 Series
Our HART0 probes have 0° of Tilt Compensation, and are available in lengths of 1 µm, 2 µm, and 4 µm.
Base Specifications: Length (µm): 125 Spring Constant (N/m): 40 Frequency (kHz): 300

HART3 Series
Our HART0 probes have 3° of Tilt Compensation, and are available in lengths of 1 µm, 2 µm, and 4 µm.
Base Specifications: Length (µm): 125 Spring Constant (N/m): 40 Frequency (kHz): 300

HART12 Series
Our HART0 probes have 12° of Tilt Compensation, and are available in lengths of 2 µm, 4 µm, and 6 µm.
Base Specifications: Length (µm): 125 Spring Constant (N/m): 40 Frequency (kHz): 300