Browse AFM probes by Application Mode
Tapping / Non-Contact Mode
Tapping mode or non-contact mode can also be called dynamic force mode, intermittent contact mode, wave mode, and acoustic AC mode by AFM manufacturers. Probes with higher spring constants and frequencies are ideal for this application.
One of the most common modes for AFM users, probes used for contact mode applications have a low spring constant and frequency.
When imaging biological samples, a soft cantilever with gold coating is often the preferred probe of choice. We offer many models with varied spring constants and frequencies to best match your application mode.
Custom Application Cantilevers
For the myriad of custom AFM applications, tipless probes provide the greatest versatility. We offer tipless probes for tapping, contact, and force modulation modes.
Electrical Force Microscopy (EFM)
Our electric force microscopy probes are platinum coated for use in many electrical applications such as Scanning Capacitance Microscopy (SCM), Conducting AFM (CAFM) and Scanning Capacitance Microscopy (SCM).
Force modulation imaging determines the varied materials that make up a surface by measuring differences in surface stiffness or elasticity. Probes with a medium spring constant and frequency are best suited for this application.
High Resolution Imaging
Super sharp probes provide enhanced resolution imaging, and feature a higher aspect ratio near the apex than standard silicon probes.
Magnetic Force Imaging
Magnetic force microscopy uses magnetic coated probes to gather information about the topography and the magnetic properties of a sample’s surface. Choose a probe with the right thickness of magnetic coating here.
Trench Depth Measurement
Our high aspect ratio probes are fine-tuned for measuring trenches up to 6 μm deep. They are available in various tilt compensations and spike lengths depending on your AFM equipment’s requirements.
Thin membranes made of Silicon, Silicon Oxide, or Silicon Nitride