Standard Silicon Probes
Standard silicon probes are available for tapping mode, contact mode, and force modulation mode applications.
High Resolution Imaging Probes
Super sharp probes provide enhanced resolution imaging, and feature a higher aspect ratio near the apex than standard silicon probes.
Magnetic Force Microscopy (MFM) Probes
Magnetic force microscopy probes are used to determine information about the topography and the magnetic properties of a surface.
Electrical Force Micoscopy (EFM) Probes
Electric force microscopy probes are useful for many electrical applications such as Conducting AFM (CAFM) and Scanning Capacitance Microscopy (SCM).
Trench Depth Measurement Probes
High aspect ratio probes are fine-tuned for depth trench measuring, and are available in various tilt compensations and spike lengths.
Silicon Nitride Probes
Silicon nitride probes have a bare silicon tip. They are ideally suited for imaging biological samples in both air and fluid mediums, and are available with a variety of spring constants.
Custom Application Probes
Tipless probes provide great versatility for a variety of special applications. They are available in tapping, contact, and force modulation modes.
Membranes
These products can be tailored for a wide range of biological research applications. We have standard and custom nanopore options available.
