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ANSCM-PA |
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ANSCM-PA probes are non-contact / tapping mode probes designed for Electronic Force Microscopy applications. These probes are coated on the reflex and tip sides with a thin layer of Pt-Ir, which allows for high resolution imaging.
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Tip Specifications |
| Material: Silicon |
| Shape: Pyramidal |
| Height (µm): 14-16 |
| Aspect Ratio: 1.5-3.0 |
| ROC* (nm): 30 |
| Coating: Pt/Ir, 25 nm ± 5 |
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* Nominal specification; guaranteed < 40 nm |
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Cantilever Specifications
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Material: Silicon |
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Shape: Rectangular |
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Reflex Coating: Pt/Ir, 25 nm ± 5 |
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ANSCM-PA.pdf
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Parameter |
Nominal Value |
Minimum Value |
Maximum Value |
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Spring Constant (N/m) |
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40 |
25 |
75 |
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300 |
200 |
400 |
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125 |
115 |
135 |
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35 |
30 |
40 |
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4.5 |
4.0 |
5.0 |
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Frequency (kHz) |
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Length (µm) |
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Width (µm) |
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Thickness (µm) |
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Ordering Information: |
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Part Number |
No. of Probes
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Pricing |
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ANSCM-PA-10 |
10 |
$411 |
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ANSCM-PA-20 |
20 |
$706 |
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ANSCM-PA-50 |
50 |
$1,574 |
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ANSCM-PA-200 |
200 |
$4,963 |
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ANSCM-PA-W |
410 - 424 |
$8,316 |
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For further information or to place an order, please contact your
local distributor or contact
Applied NanoStructures directly.
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