A symphony of silicon! This close-up showcases the intricate array of AFM chips meticulously etched onto a single wafer, ready to be born into the world of nanotechnology.

This close-up view unveils a wafer teeming with potential AFM chips. Each tiny rectangle holds the power to image and manipulate the world at the atomic level.

Step Height Standards (SHS) are designed for X, Y, and Z calibration of scanning probe microscopes and profilometers. Our Step Height Standard features are available in two heights and are defined in thermally grown silicon dioxide on silicon substrate. A layer of Cr is deposited on the standard model to harden the surface.